☆ 4.6 Article

Regular ripples at the surfaces of heteroepitaxially grown Ag(111) ultra-thin films on Si(111) √3 x √3-B substrates

APPLIED PHYSICS LETTERS (2014)

期刊

APPLIED PHYSICS LETTERS

卷 104, 期 19, 页码 -

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AMER INST PHYSICS

DOI: 10.1063/1.4878323

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Physics, Applied

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Faint ripples were observed at the flat surfaces of 10-monolayer-thick Ag films grown on Si(111) root 3 x root 3-B substrates using scanning tunneling microscopy. The ripples have the 3 x 3 periodicity and showed no dependence on the bias voltage. The ripples are considered to reflect the Ag(111) 1 x 1 and Si(111) root 3 x root 3-B lattice commensuration at the buried interface, which propagates to the upper layers and causes the geometric corrugation at the Ag film surface. (C) 2014 AIP Publishing LLC.

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