期刊
APPLIED PHYSICS LETTERS
卷 104, 期 6, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.4864758
关键词
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资金
- Incheon National University International Cooperative Research Grant
- U.S. Department of Energy [DOE-AC36-08GO28308]
- NREL
We report on direct imaging of current collection by performing conductive atomic force microscopy (C-AFM) measurement on a complete Cu(In,Ga)Se-2 solar cell. The localized current was imaged by milling away the top conductive layer of the device by repeated C-AFM scans. The result exhibits enhanced photocurrent collection on grain boundaries (GBs) of CIGS films, consistent with the argument for electric-field-assisted carrier collection on the GBs. (C) 2014 AIP Publishing LLC.
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