Integration of on-chip field-effect transistor switches with dopantless Si/SiGe quantum dots for high-throughput testing

标题
Integration of on-chip field-effect transistor switches with dopantless Si/SiGe quantum dots for high-throughput testing
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 102, Issue 21, Pages 213107
出版商
AIP Publishing
发表日期
2013-05-30
DOI
10.1063/1.4807768

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