期刊
APPLIED PHYSICS LETTERS
卷 102, 期 24, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.4811708
关键词
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资金
- ONR [N000140610138]
- EFRC Center for Re-Defining Photovoltaic Efficiency through Molecule Scale Control [DE-SC0001085]
- NSF [CHE-0641523]
- NYSTAR
- CSIC-PIF [200950I154]
- Spanish CAM (QC Light) [S2009ESP-1503]
- Spanish CAM (Numancia 2) [S2009/ENE-1477]
- Spanish MEC [ENE2009-14481-C02-02, TEC2011-29120-C05-04, MAT2011-26534]
We have used the ratio of the integrated intensity of graphene's Raman G peak to that of the silicon substrate's first-order optical phonon peak, accurately to determine the number of graphene layers across our molecular-beam (MB) grown graphene films. We find that these results agree well both, with those from our own exfoliated single and few-layer graphene flakes, and with the results of Koh et al. [ACS Nano 5, 269 (2011)]. We hence distinguish regions of single-, bi-, tri-, four-layer, etc., graphene, consecutively, as we scan coarsely across our MB-grown graphene. This is the first, but crucial, step to being able to grow, by such molecular-beam-techniques, a specified number of large-area graphene layers, to order. (C) 2013 AIP Publishing LLC.
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