期刊
APPLIED PHYSICS LETTERS
卷 102, 期 7, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.4792348
关键词
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资金
- National University of Singapore (NUS)
- Singapore's National Research Foundation (NRF) through the Singapore Economic Development Board (EDB)
A contactless method to extract spatially resolved electrical parameters of silicon wafers and silicon solar cells is introduced. The method is based on photoluminescence imaging and can be applied throughout the solar cell fabrication process, even before junction formation. To validate the method, the parameters obtained by it are compared to the ones obtained by the well-established Suns-Voc measurement. Good agreement is obtained. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4792348]
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