Optimization of sample-chip design for stub-matched radio-frequency reflectometry measurements

标题
Optimization of sample-chip design for stub-matched radio-frequency reflectometry measurements
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 101, Issue 4, Pages 042112
出版商
AIP Publishing
发表日期
2012-07-28
DOI
10.1063/1.4739248

向作者/读者发起求助以获取更多资源

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now