Experimental confirmation of temperature dependent negative capacitance in ferroelectric field effect transistor

标题
Experimental confirmation of temperature dependent negative capacitance in ferroelectric field effect transistor
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 100, Issue 16, Pages 163504
出版商
AIP Publishing
发表日期
2012-04-20
DOI
10.1063/1.4704179

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