4.6 Article

Comparative study of n-MgZnO/p-Si ultraviolet-B photodetector performance with different device structures

期刊

APPLIED PHYSICS LETTERS
卷 98, 期 26, 页码 -

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AMER INST PHYSICS
DOI: 10.1063/1.3600789

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  1. National Science Foundation [61076007, 50532090, 60606023, 50825206]
  2. Ministry of Science and Technology of China [2007CB936203, 2009CB929400, 2009AA033101, 2011CB302002]
  3. Chinese Academy of Sciences

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A comparative study of n-MgZnO/p-Si UV-B photodetector performance was carried out with different device structures. The experimental results demonstrate superior photoresponse characteristics of the p-n heterojunction detector against the Schottky type metal-semiconductor-metal counterpart, including a sharper cutoff wavelength at 300 nm, a larger peak photoresponsivity of 1 A/W, and a faster response speed. The role of built-in field and low interface scattering in p-n heterojunction is explored, and the energy band diagram of n-MgZnO/p-Si is employed to interpret the efficient suppression of visible light photoresponse from Si substrate, revealing the applicability of this heterostructure in fabrication of deep ultraviolet detectors. (C) 2011 American Institute of Physics. [doi:10.1063/1.3600789]

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