Analysis of untreated cross sections of Cu(In,Ga)Se2 thin-film solar cells with varying Ga content using Kelvin probe force microscopy

标题
Analysis of untreated cross sections of Cu(In,Ga)Se2 thin-film solar cells with varying Ga content using Kelvin probe force microscopy
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 99, Issue 4, Pages 042111
出版商
AIP Publishing
发表日期
2011-08-01
DOI
10.1063/1.3607954

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