Article
Engineering, Electrical & Electronic
Chih-Yao Chang, Chien-Sheng Wang, Ching-Yao Wang, Yao-Luen Shen, Tian-Li Wu, Wei-Hung Kuo, Suh-Fang Lin, Chih-Fang Huang
Summary: This study demonstrates the performance of p-GaN/AlGaN/GaN HEMTs with ITO gate electrodes, showing excellent current and resistance characteristics. The robustness of the ITO gate electrode and its potential as a promising alternative technology for p-GaN HEMTs, compatible with LED processes, are highlighted in comparison to devices with Ni/Au Schottky gate contacts.
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY
(2021)
Article
Nanoscience & Nanotechnology
Hanyuan Zhang, Ying Gan, Shu Yang, Kuang Sheng, Ping Wang
Summary: The AlGaN/GaN sensor offers superior detection performance and background noise suppression, leading to enhanced sensitivity for BNP detection. Through improved techniques and optimized packaging design, the LOD was successfully reduced to 0.097 pg/mL.
MICROSYSTEMS & NANOENGINEERING
(2021)
Article
Physics, Applied
Hanghai Du, Zhihong Liu, Lu Hao, Guangjie Gao, Weichuan Xing, Weihang Zhang, Yachao Zhang, Hong Zhou, Shenglei Zhao, Jincheng Zhang, Yue Hao
Summary: In this study, sub-60 mV/dec subthreshold swings (SS) were achieved in GaN-based metal-insulator-semiconductor high electron mobility transistors (MISHEMTs). The SS values remained consistent regardless of the direction of the gate bias sweep. The observed physical mechanisms responsible for the small SS include capture and emission of electrons in traps.
APPLIED PHYSICS LETTERS
(2023)
Article
Chemistry, Analytical
Tae-Hyeon Kim, Won-Ho Jang, Jun-Hyeok Yim, Ho-Young Cha
Summary: A rectifying drain electrode embedded in a p-GaN gate AlGaN/GaN heterojunction field-effect transistor was proposed to achieve unidirectional switching characteristics successfully. The concept was validated through TCAD simulation and experimental demonstration. The fabricated device exhibited the unidirectional characteristics with promising performance parameters.
Article
Chemistry, Multidisciplinary
Kuan-Chang Chang, Xibei Feng, Huangbai Liu, Kai Liu, Xinnan Lin, Lei Li
Summary: This study proposes an effective and accurate computational-fitting method for extracting the mobility of GaN HEMT. The method involves measuring the total resistance between source and drain at different gate voltages and fitting the total resistance with respect to the overdrive voltage to determine the carrier mobility and the non-gate resistance.
Article
Engineering, Electrical & Electronic
June-Heang Choi, Hyungtak Kim, Ho-Young Cha
Summary: It was found that the recessed heterojunction sensor demonstrated superior sensing characteristics and significantly lower standby power consumption under reverse bias operation, compared to forward bias operation.
IEEE SENSORS JOURNAL
(2021)
Article
Computer Science, Information Systems
Yanxu Zhu, Xiaomeng Song, Jianwei Li, Jinheng Li, Baoliang Fei, Peiyang Li, Fajun Li
Summary: In this paper, a novel ring-gate structure AlGaN/GaN HEMT device is proposed and its performance is improved through optimization designs. By changing the electrode structure and device size parameters, the drain current and threshold voltage are successfully enhanced, and better output characteristics are achieved.
Article
Engineering, Electrical & Electronic
Chia-Hao Liu, Hsien-Chin Chiu, Hsiang-Chun Wang, Hsuan-Ling Kao, Chong-Rong Huang
Summary: The study shows that DJ-HEMT exhibits higher gate voltage swing in the gate region due to the dual junction, enhancing gate performance. Compared to ST-HEMT, DJ-HEMT has higher V-TH, saturation current, I-ON/I-OFF ratio, and gate swing voltage. In addition, DJ-HEMT also has lower leakage current and longer lifetime measurement.
IEEE ELECTRON DEVICE LETTERS
(2021)
Article
Materials Science, Multidisciplinary
Akhil S. Kumar, Swaroop Ganguly, Dipankar Saha
Summary: Through partial overlapping gate transistors, a trade-off can be found between gate leakage current, I-OFF, and I-ON/I-OFF.
PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS
(2022)
Article
Engineering, Electrical & Electronic
Md. Tasnim Azad, Toiyob Hossain, Bejoy Sikder, Qingyun Xie, Mengyang Yuan, Eiji Yagyu, Koon Hoo Teo, Tomas Palacios, Nadim Chowdhury
Summary: This work proposes a multimetal gated architecture to improve the linearity of AlGaN/GaN HEMT. Through experimental and simulation analysis, it is found that using different gate metals can reduce the value of third-order transconductance. The proposed device exhibits better compression point, saturation output power, and power added efficiency, and shows excellent linearity performance under deep class AB bias.
IEEE TRANSACTIONS ON ELECTRON DEVICES
(2023)
Article
Engineering, Electrical & Electronic
Kai Liu, Runhao Wang, Chong Wang, Xuefeng Zheng, Xiaohua Ma, Junchun Bai, Bin Cheng, Ruiyu Liu, Ang Li, Yaopeng Zhao, Yue Hao
Summary: This paper investigates the influence of a lightly doped p-GaN cap layer on p-GaN/AlGaN/GaN high electron mobility transistors (HEMTs). The results show that the p(-)-GaN cap layer optimizes the gate characteristics, significantly reduces the gate leakage voltage, and increases the gate forward breakdown voltage and continuous operating voltage. Furthermore, simulation results demonstrate that the p(-)-GaN cap layer disperses the electric field and alleviates the electric peak, thereby suppressing impact ionization and carrier injection.
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
(2022)
Article
Engineering, Electrical & Electronic
Chao Feng, Qimeng Jiang, Sen Huang, Xinhua Wang, Xinyu Liu
Summary: In this study, the recovery of transient threshold voltage (V-TH) in Schottky-type p-GaN Gate AlGaN/GaN high-electron-mobility-transistors (HEMTs) was measured using a microsecond-level fast-tracking method. It was found that applying an appropriate positive forward gate bias during the gate turn-off transient can significantly accelerate the recovery speed of V-TH, contradicting the conventional use of negative gate turn-off voltage. The dominant recovery mechanism was speculated to be the electrical-field assisted emission of electron trap in the p-GaN depletion region, which was supported by comparing the recovery process between predamage device and fresh device. An electron trap with a depth of 0.30 +/- 0.03 eV was extracted using the Arrhenius plot. This work is of great importance in understanding the mechanism of threshold voltage recovery and suggests that a positive gate base voltage can accelerate the V-TH recovery.
IEEE TRANSACTIONS ON ELECTRON DEVICES
(2023)
Article
Engineering, Electrical & Electronic
Anwar Jarndal, L. Arivazhagan, Eqab Almajali, Soliman Mahmoud, Sohaib Majzoub, Talal Bonny
Summary: In the current state of the art, most GaN HEMT-based sensors provide current readout and focus on surface optimization. This paper proposes a back-barrier technique to improve the sensitivity of GaN-based sensors, using voltage readout for measurement and validating the performance through TCAD simulation and measured data. The proposed back-barrier technique achieves a 14% improvement in sensitivity compared to existing techniques.
IEEE SENSORS JOURNAL
(2022)
Article
Computer Science, Information Systems
Mohammad Abdul Alim, Abu Zahed Chowdhury, Shariful Islam, Christophe Gaquiere, Giovanni Crupi
Summary: This paper provides a comparative analysis of the thermal impact on the microwave performance of high electron-mobility transistors (HEMTs) based on GaAs and GaN technologies, showing that while similar trends are observed for the two different technologies, the impact of temperature is more pronounced in the GaN device.
Article
Physics, Condensed Matter
Praveen Pal, Yogesh Pratap, Mridula Gupta, Sneha Kabra
Summary: A physics-based analytical model has been proposed for an open gate AlGaN/GaN HEMT for electrical detection of biomolecules, achieving high sensitivity and good agreement with experimental results through optimization of device design and analysis of electrical parameters.
SUPERLATTICES AND MICROSTRUCTURES
(2021)
Article
Biophysics
Samit Gupta, Mark Elias, Xuejin Wen, John Shapiro, Leonard Brillson, Wu Lu, Stephen Craig Lee
BIOSENSORS & BIOELECTRONICS
(2008)
Article
Multidisciplinary Sciences
Wen XueJin, Wang ShengNian, Wang YuJi, Ly James Lee, Lu Wu
CHINESE SCIENCE BULLETIN
(2013)
Article
Engineering, Electrical & Electronic
Xuejin Wen, Michael L. Schuette, Samit Kumar Gupta, Theodore R. Nicholson, Stephen Craig Lee, Wu Lu
IEEE SENSORS JOURNAL
(2011)
Article
Engineering, Electrical & Electronic
Paul Bertani, Xuejin Wen, Wu Lu
JOURNAL OF ELECTRONIC MATERIALS
(2012)
Article
Physics, Applied
Samit K. Gupta, Hao-Hsuan Wu, Kwang J. Kwak, Patricia Casal, Theodore R. Nicholson, Xuejin Wen, R. Anisha, Bharat Bhushan, Paul R. Berger, Wu Lu, Leonard J. Brillson, Stephen Craig Lee
JOURNAL OF PHYSICS D-APPLIED PHYSICS
(2011)
Article
Chemistry, Multidisciplinary
Kwang Joo Kwak, Gintaras Valincius, Wei-Ching Liao, Xin Hu, Xuejin Wen, Andrew Lee, Bo Yu, David J. Vanderah, Wu Lu, L. James Lee
Article
Multidisciplinary Sciences
Patricia Casal, Xuejin Wen, Samit Gupta, Theodore Nicholson, Yuji Wang, Andrew Theiss, Bharat Bhushan, Leonard Brillson, Wu Lu, Stephen C. Lee
PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES
(2012)
Proceedings Paper
Materials Science, Multidisciplinary
Xuejin Wen, Samit Gupta, Theodore R. Nicholson, Stephen C. Lee, Wu Lu
PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 8, NO 7-8
(2011)
Article
Engineering, Electrical & Electronic
Bhuwan Joshi, Xuejin Wen, Kai Sun, Wu Lu, Qi-Huo Wei
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
(2010)