期刊
APPLIED PHYSICS LETTERS
卷 97, 期 6, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3478215
关键词
cobalt; ferromagnetic materials; photoelectron microscopy; X-ray microscopy
资金
- Office of Science, Office of Basic Energy Sciences, Materials Sciences, and Engineering Division, of the U.S. Department of Energy [DE-AC02-05CH11231]
We demonstrate the addition of depth resolution to the usual two-dimensional images in photoelectron emission microscopy (PEEM), with application to a square array of circular magnetic Co microdots. The method is based on excitation with soft x-ray standing-waves generated by Bragg reflection from a multilayer mirror substrate. Standing wave is moved vertically through sample simply by varying the photon energy around the Bragg condition. Depth-resolved PEEM images were obtained for all of the observed elements. Photoemission intensities as functions of photon energy were compared to x-ray optical calculations in order to quantitatively derive the depth-resolved film structure of the sample. (C) 2010 American Institute of Physics. [doi:10.1063/1.3478215]
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