4.6 Article

Photoluminescence-based measurements of the energy gap and diffusion length of Zn3P2

期刊

APPLIED PHYSICS LETTERS
卷 95, 期 11, 页码 -

出版社

AMER INST PHYSICS
DOI: 10.1063/1.3225151

关键词

-

资金

  1. Office of Energy Efficiency and Renewable Energy
  2. U. S. Department of Energy [DE-FG36-08GO18006]
  3. Caltech Center for Sustainable Energy Research (CCSER)
  4. Beckman Institute Laser Resource Center (BILRC)

向作者/读者索取更多资源

The steady-state photoluminescence spectra of zinc phosphide (Zn3P2) wafers have revealed a fundamental indirect band gap at 1.38 eV, in close proximity to the direct band gap at 1.50 eV. These values are consistent with the values for the indirect and direct band gaps obtained from analysis of the complex dielectric function deduced from spectroscopic ellipsometric measurements. Bulk minority carrier lifetimes of 20 ns were observed by time-resolved photoluminescence decay measurements, implying minority-carrier diffusion lengths of >= 7 mu m. (C) 2009 American Institute of Physics. [doi: 10.1063/1.3225151]

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.6
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据