4.6 Article

Thickness dependent electronic structure of La0.6Sr0.4MnO3 layer in SrTiO3/La0.6Sr0.4MnO3/SrTiO3 heterostructures studied by hard x-ray photoemission spectroscopy

期刊

APPLIED PHYSICS LETTERS
卷 94, 期 7, 页码 -

出版社

AMER INST PHYSICS
DOI: 10.1063/1.3081016

关键词

band structure; Fermi level; lanthanum compounds; metal-insulator transition; multilayers; strontium compounds; X-ray photoelectron spectra

资金

  1. Japan Society for the Promotion of Science [A19684010, A19204037]

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The authors have investigated changes in the electronic structures of digitally controlled La0.6Sr0.4MnO3 (LSMO) layers sandwiched between SrTiO3 as a function of LSMO layer thickness in terms of hard x-ray photoemission spectroscopy (HX-PES). The HX-PES spectra show the evolution of Mn 3d derived states near the Fermi level and the occurrence of metal-insulator transition at 8 ML. The detailed analysis for the thickness dependent HX-PES spectra reveals the existence of the less conducting and nonmagnetic transition layer with a film thickness of about 4 ML in the interface region owing to significant interaction through the interface.

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