The Fermi-level efficiency method and its applications on high interface trap density oxide-semiconductor interfaces

标题
The Fermi-level efficiency method and its applications on high interface trap density oxide-semiconductor interfaces
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 94, Issue 15, Pages 153508
出版商
AIP Publishing
发表日期
2009-04-18
DOI
10.1063/1.3113523

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