Defect-induced negative differential resistance of GaN nanowires measured by conductive atomic force microscopy

标题
Defect-induced negative differential resistance of GaN nanowires measured by conductive atomic force microscopy
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 94, Issue 18, Pages 182101
出版商
AIP Publishing
发表日期
2009-05-05
DOI
10.1063/1.3130728

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