Gate-defined quantum-dot devices realized in InGaAs/InP by incorporating a HfO2 layer as gate dielectric

标题
Gate-defined quantum-dot devices realized in InGaAs/InP by incorporating a HfO2 layer as gate dielectric
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 94, Issue 4, Pages 042114
出版商
AIP Publishing
发表日期
2009-02-03
DOI
10.1063/1.3077188

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