4.6 Article

Temperature-dependent Hall and photoluminescence evidence for conduction-band edge shift induced by alloying ZnO with magnesium

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APPLIED PHYSICS LETTERS
卷 95, 期 15, 页码 -

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AMER INST PHYSICS
DOI: 10.1063/1.3236771

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  1. National Science Foundation [DMR 0907191, DMR 0308012]
  2. Chinese Natural Science Foundation [50428202]
  3. IMRA America, Inc.
  4. Intel

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This work discusses the effect of conduction-band edge shift induced by alloying ZnO with magnesium. Temperature-dependent Hall and temperature-dependent photoluminescence measurements are used to characterize the epitaxial Zn(1-x)Mg(x)O thin films grown on (111) Si using intervening epitaxial Lu(2)O(3) buffer layers, which prove that the addition of Mg in ZnO shifts the conduction-band edge to higher energy, thus increasing the activation energy of the defect donor states and reducing the n-type background carrier concentration. (C) 2009 American Institute of Physics. [doi:10.1063/1.3236771]

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