期刊
APPLIED PHYSICS LETTERS
卷 95, 期 15, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3236771
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资金
- National Science Foundation [DMR 0907191, DMR 0308012]
- Chinese Natural Science Foundation [50428202]
- IMRA America, Inc.
- Intel
This work discusses the effect of conduction-band edge shift induced by alloying ZnO with magnesium. Temperature-dependent Hall and temperature-dependent photoluminescence measurements are used to characterize the epitaxial Zn(1-x)Mg(x)O thin films grown on (111) Si using intervening epitaxial Lu(2)O(3) buffer layers, which prove that the addition of Mg in ZnO shifts the conduction-band edge to higher energy, thus increasing the activation energy of the defect donor states and reducing the n-type background carrier concentration. (C) 2009 American Institute of Physics. [doi:10.1063/1.3236771]
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