期刊
APPLIED PHYSICS LETTERS
卷 93, 期 18, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3003582
关键词
crystal structure; electron diffraction; elemental semiconductors; nanostructured materials; silicon; transmission electron microscopy
资金
- MEXT KAKENHI [18029011]
- JSPS KAKENHI [17201022]
- Grants-in-Aid for Scientific Research [18029011, 17201022] Funding Source: KAKEN
The dumbbell structure in crystalline silicon as known with the separation of 0.136 nm has been reconstructed clearly by diffractive imaging using an electron beam. The spatial resolution in the result is estimated at about 0.1 nm. By utilizing the selected area diffraction technique in a spherical-aberration-corrected transmission electron microscope, one can reconstruct nanostructures with atomic resolution, even if they are not surrounded by empty space such as localized structures embedded in thin film samples. This means that the present method has a unique potential to expand the versatility of diffractive imaging by electron beams drastically.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据