Atomic force microscopy measurement of the Young’s modulus and hardness of single LaB6 nanowires

标题
Atomic force microscopy measurement of the Young’s modulus and hardness of single LaB6 nanowires
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 92, Issue 17, Pages 173121
出版商
AIP Publishing
发表日期
2008-05-04
DOI
10.1063/1.2919718

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