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Defect reduction by epitaxial lateral overgrowth of nanorods in ZnO/(0001) sapphire films

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APPLIED PHYSICS LETTERS
卷 92, 期 5, 页码 -

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AMER INST PHYSICS
DOI: 10.1063/1.2841707

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It is shown that epitaxial ZnO/(0001) sapphire films grown by pulsed laser deposition have defect-free Zn-polar nanorods protruding from a continuous O-polar underlayer containing high densities of threading dislocations (TDs). By continuing the ZnO growth hydrothermally, the nanorods grew laterally over the O-polar layer. TDs in the underlayer were thereby blocked and only formed in the overlayer when nanorods coalesced. This epitaxial lateral overgrowth produced continuous Zn-polar films with TD densities reduced to 1x10(9)/cm(2) from 7x10(10)/cm(2) in the underlayer. It is noted that the same growth mode can be achieved in GaN/(0001) sapphire films. (c) 2008 American Institute of Physics.

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