High-resolution characterization of defects in oxide thin films - Peeref

标题

High-resolution characterization of defects in oxide thin films

作者

关键词

-

出版物

APPLIED PHYSICS LETTERS

Volume 93, Issue 18, Pages 182101

出版商

AIP Publishing

发表日期

2008-11-04

DOI

10.1063/1.2982082

参考文献

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Protocol

Reagent

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