Extended-Defect-Related Photoluminescence Line at 3.33 eV in Nanostructured ZnO Thin Films

标题
Extended-Defect-Related Photoluminescence Line at 3.33 eV in Nanostructured ZnO Thin Films
作者
关键词
-
出版物
Applied Physics Express
Volume 6, Issue 11, Pages 111101
出版商
Japan Society of Applied Physics
发表日期
2013-11-05
DOI
10.7567/apex.6.111101

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