期刊
APPLIED PHYSICS B-LASERS AND OPTICS
卷 116, 期 3, 页码 585-591出版社
SPRINGER
DOI: 10.1007/s00340-013-5737-2
关键词
-
资金
- German Research Foundation (DFG) through Priority Program 1391 Ultrafast Nanooptics
- Danish Council for Independent Research (FTP project ANAP) [09-072949]
Two-photon photoemission electron microscopy (2P-PEEM) is used to measure the real and imaginary part of the dispersion relation of surface plasmon polaritons at different interface systems. A comparison of calculated and measured dispersion data for a gold/vacuum interface demonstrates the capability of the presented experimental approach. A systematic 2P-PEEM study on the dispersion relation of dielectric-loaded gold surfaces shows how effective the propagation of surface plasmon polaritons at a gold/para-hexaphenylene interface can be tuned by adjustment of the dielectric film thickness. Deviations of the experimental results from effective index calculations indicate the relevance of thin film peculiarities arising from the details of the growth process and corroborate the need of experimental analysis techniques for dispersion relation measurements.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据