Direct Observation of Atomic Dynamics and Silicon Doping at a Topological Defect in Graphene

标题
Direct Observation of Atomic Dynamics and Silicon Doping at a Topological Defect in Graphene
作者
关键词
-
出版物
ANGEWANDTE CHEMIE-INTERNATIONAL EDITION
Volume 53, Issue 34, Pages 8908-8912
出版商
Wiley
发表日期
2014-07-01
DOI
10.1002/anie.201403382

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