期刊
ANGEWANDTE CHEMIE-INTERNATIONAL EDITION
卷 52, 期 8, 页码 2289-2292出版社
WILEY-V C H VERLAG GMBH
DOI: 10.1002/anie.201207857
关键词
atomic force microscopy; dielectric layers; electrowetting; ionic liquids; surface chemistry
资金
- University of Kentucky
- Chinese Government Scholarship
- Kentucky Opportunity Fellowship