The use of Au/SiOx interfaces for the investigation of DNA hybridization using electrochemical impedance spectroscopy ( EIS) and surface plasmon resonance (SPR) simultaneously is demonstrated. Standard glass chemistry was used to link single-stranded DNA (ss-DNA) on aldehyde-terminated Au/SiOx interfaces. The layer thickness and amount of grafted oligonucleotides (ODNs) were calculated from SPR on the basis of a multilayer system of glass/Ti/Au/SiOx/grafted molecule. Capacitance and resistance values of the modified interface before and after hybridization were calculated from EIS data using an equivalent circuit and allowed the affinity rate constant, K-A = 4.07 x 10(5) M-1, to be determined. The EIS results were comparable to those obtained by SPR hybridization kinetics recorded in parallel.
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