Intrinsic Topological Insulator Bi2Te3 Thin Films on Si and Their Thickness Limit

标题
Intrinsic Topological Insulator Bi2Te3 Thin Films on Si and Their Thickness Limit
作者
关键词
-
出版物
ADVANCED MATERIALS
Volume 22, Issue 36, Pages 4002-4007
出版商
Wiley
发表日期
2010-07-21
DOI
10.1002/adma.201000368

向作者/读者发起求助以获取更多资源

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started