Plasmonic Internal Photoemission for Accurate Device In Situ Measurement of Metal-Organic Semiconductor Injection Barriers

标题
Plasmonic Internal Photoemission for Accurate Device In Situ Measurement of Metal-Organic Semiconductor Injection Barriers
作者
关键词
-
出版物
ADVANCED FUNCTIONAL MATERIALS
Volume 24, Issue 30, Pages 4775-4781
出版商
Wiley
发表日期
2014-05-03
DOI
10.1002/adfm.201400344

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