Devices, Materials, and Processes for Nanoelectronics: Characterization with Advanced X-Ray Techniques Using Lab-Based and Synchrotron Radiation Sources
出版年份 2011 全文链接
标题
Devices, Materials, and Processes for Nanoelectronics: Characterization with Advanced X-Ray Techniques Using Lab-Based and Synchrotron Radiation Sources
作者
关键词
-
出版物
ADVANCED ENGINEERING MATERIALS
Volume 13, Issue 8, Pages 811-836
出版商
Wiley
发表日期
2011-03-04
DOI
10.1002/adem.201000327
参考文献
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