期刊
ACTA MATERIALIA
卷 78, 期 -, 页码 114-124出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.actamat.2014.06.022
关键词
Grain growth; Triple junctions; Grain size distributions; Computer simulations; Thin films
资金
- Deutsche Forschungsgemeinschaft (DFG)
Triple junction controlled grain growth in two-dimensional nanocrystalline polycrystals is modeled by attributing to each structural feature of a polygonal grain a finite mobility. By considering grain growth as a dissipative process that is driven by the reduction of the Gibbs free interface energy, a general grain evolution equation is derived that separates into two types of possible self-similar growth kinetics. For the case of pure triple junction drag the influence of finite triple junction mobilities on metrical and topological properties is studied. Analytical expressions of the self-similar grain size distribution are derived, which compare very well with results from the modified Monte Carlo Potts model and front-tracking vertex dynamic simulations, taking into account size effects in triple junction limited grain growth. In addition, the analytical grain size distributions are used for a theoretical description of experimental data obtained in nanocrystalline thin films upon annealing. (C) 2014 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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