Correlation between the microstructure studied by X-ray line profile analysis and the strength of high-pressure-torsion processed Nb and Ta

标题
Correlation between the microstructure studied by X-ray line profile analysis and the strength of high-pressure-torsion processed Nb and Ta
作者
关键词
-
出版物
ACTA MATERIALIA
Volume 61, Issue 2, Pages 632-642
出版商
Elsevier BV
发表日期
2012-11-13
DOI
10.1016/j.actamat.2012.10.008

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