Raman and Photocurrent Imaging of Electrical Stress-Induced p–n Junctions in Graphene

出版年份 2011 全文链接

标题

作者

关键词

出版物

Volume 5, Issue 7, Pages 5848-5854

出版商

American Chemical Society (ACS)

发表日期

2011-06-16

DOI

10.1021/nn201611r

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