4.8 Article

Charge Control of Surface Dangling Bonds Using Nanoscale Schottky Contacts

期刊

ACS NANO
卷 5, 期 3, 页码 1984-1989

出版社

AMER CHEMICAL SOC
DOI: 10.1021/nn103042m

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scanning tunneling microscopy; dangling bonds; silicon; Schottky; titanium; suicide

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  2. CIFAR

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Titanium silicide (TiSi2) nanoscale Schottky contacts were prepared on hydrogen-terminated n-type Si (100) surfaces. The Schottky contact created a region of upward band bending surrounding the TiSi2 contacts. The surface band bending was observed as a sloping surface depression using the scanning tunneling microscope. Scanning tunneling spectroscopy measurements also show shifted I/V data consistent with upward band bending. Charge control of dangling bonds was accomplished through a distance relationship between the dangling bond and the TiSi2 contact. The lowered chemical potential in the near contact region removes the ability of dangling bonds to become negatively charged while dangling bonds outside the close contact region remain fully charged. Methods to actively control dangling bond charge states are discussed.

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