Modulation of Surface Trap Induced Resistive Switching by Electrode Annealing in Individual PbS Micro/Nanowire-Based Devices for Resistance Random Access Memory

标题
Modulation of Surface Trap Induced Resistive Switching by Electrode Annealing in Individual PbS Micro/Nanowire-Based Devices for Resistance Random Access Memory
作者
关键词
-
出版物
ACS Applied Materials & Interfaces
Volume 6, Issue 23, Pages 20812-20818
出版商
American Chemical Society (ACS)
发表日期
2014-11-14
DOI
10.1021/am505101w

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