Reduced Workfunction Intermetallic Seed Layers Allow Growth of Porous n-GaN and Low Resistivity, Ohmic Electron Transport

标题
Reduced Workfunction Intermetallic Seed Layers Allow Growth of Porous n-GaN and Low Resistivity, Ohmic Electron Transport
作者
关键词
-
出版物
ACS Applied Materials & Interfaces
Volume 4, Issue 12, Pages 6927-6934
出版商
American Chemical Society (ACS)
发表日期
2012-11-21
DOI
10.1021/am3020668

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