Encapsulating Ion-Solid Interactions in Metal-Oxide-Semiconductor (MOS) Devices

标题
Encapsulating Ion-Solid Interactions in Metal-Oxide-Semiconductor (MOS) Devices
作者
关键词
-
出版物
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume 62, Issue 6, Pages 3346-3352
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2015-12-18
DOI
10.1109/tns.2015.2489468

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