标题
Frequency-Dependent Dielectric Parameters of Au/TiO2/n-Si (MIS) Structure
作者
关键词
MIS structure, Admittance measurements, Dielectric constant and loss, ac conductivity, Modulus
出版物
Silicon
Volume -, Issue -, Pages -
出版商
Springer Nature
发表日期
2018-03-26
DOI
10.1007/s12633-017-9722-y
参考文献
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