Simulation of Phosphorene Field-Effect Transistor at the Scaling Limit

标题

作者

关键词

出版物

Volume 62, Issue 2, Pages 659-665

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2014-12-19

DOI

10.1109/ted.2014.2377632

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started