4.4 Article

On the detection of multiple events in atom probe tomography

期刊

ULTRAMICROSCOPY
卷 189, 期 -, 页码 54-60

出版社

ELSEVIER SCIENCE BV
DOI: 10.1016/j.ultramic.2018.03.018

关键词

Atom probe tomography; Multiple event; Delay line detector; Dead time; Dead zone; Chemical quantification

资金

  1. BigMax project (Big-data-driven materials science) - Max Planck Society

向作者/读者索取更多资源

In atom probe tomography (APT), multiple events can arise as a consequence of e.g. correlated field evaporation and molecular ion dissociation. They represent challenging cases for single-particle detectors and can cause compositional as well as spatial inaccuracies. Here, two state-of-the-art atom probe microscopes (Cameca LEAP 5000 XS and 5000 XR) were used to investigate cemented tungsten carbide, which exhibits high amounts of multiple events. By advanced data analysis methods, the natural character of the multiple events, as well as the performance of the APT detectors, are assessed. Accordingly, possible signal loss mechanisms are discussed. (C) 2018 Elsevier B.V. All rights reserved.

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