4.4 Article

A new method for mapping the three-dimensional atomic distribution within nanoparticles by atom probe tomography (APT)

期刊

ULTRAMICROSCOPY
卷 190, 期 -, 页码 30-38

出版社

ELSEVIER SCIENCE BV
DOI: 10.1016/j.ultramic.2018.04.005

关键词

Atom probe tomography; Electrophoresis; Electroplating; Nanoparticles

资金

  1. National Research Foundation of Korea (NRF) [2016R1A2B4012426]
  2. KAIST Venture

向作者/读者索取更多资源

We present a new method of preparing needle-shaped specimens for atom probe tomography from freestanding Pd and C-supported Pt nanoparticles. The method consists of two steps, namely electrophoresis of nanoparticles on a flat Cu substrate followed by electrodeposition of a Ni film acting as an embedding matrix for the nanoparticles. Atom probe specimen preparation can be subsequently carried out by means of focused-ion-beam milling. Using this approach, we have been able to perform correlative atom probe tomography and transmission electron microscopy analyses on both nanoparticle systems. Reliable mass spectra and three-dimensional atom maps could be obtained for Pd nanoparticle specimens. In contrast, atom probe samples prepared from C- supported Pt nanoparticles showed uneven field evaporation and hence artifacts in the reconstructed atom maps. Our developed method is a viable means of mapping the three-dimensional atomic distribution within nanoparticles and is expected to contribute to an improved understanding of the structure-composition-property relationships of various nanoparticle systems. (C) 2018 Elsevier B.V. All rights reserved.

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