Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy

出版年份 2018 全文链接

标题

作者

关键词

ADF STEM, Electron scattering, Quantitative STEM, Image simulation

出版物

Volume 187, Issue -, Pages 84-92

出版商

Elsevier BV

发表日期

2018-01-31

DOI

10.1016/j.ultramic.2018.01.005

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