Ewald sphere correction using a single side-band image processing algorithm

标题
Ewald sphere correction using a single side-band image processing algorithm
作者
关键词
Ewald sphere, Single-particle reconstruction, CTF, Depth of field, cryoEM, Structure determination
出版物
ULTRAMICROSCOPY
Volume 187, Issue -, Pages 26-33
出版商
Elsevier BV
发表日期
2018-01-12
DOI
10.1016/j.ultramic.2017.11.001

向作者/读者发起求助以获取更多资源

Reprint

联系作者

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search