Artefact detection in global digital elevation models (DEMs): The Maximum Slope Approach and its application for complete screening of the SRTM v4.1 and MERIT DEMs

标题
Artefact detection in global digital elevation models (DEMs): The Maximum Slope Approach and its application for complete screening of the SRTM v4.1 and MERIT DEMs
作者
关键词
-
出版物
REMOTE SENSING OF ENVIRONMENT
Volume 207, Issue -, Pages 27-41
出版商
Elsevier BV
发表日期
2018-02-04
DOI
10.1016/j.rse.2017.12.037

向作者/读者发起求助以获取更多资源

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started