Z-scan studies of third-order nonlinear optical and optical limiting properties of chalcones doped Poly(methyl methacrylate) thin films for visible laser protection

标题
Z-scan studies of third-order nonlinear optical and optical limiting properties of chalcones doped Poly(methyl methacrylate) thin films for visible laser protection
作者
关键词
Chalcone derivatives, Hirshfeld surface analyses, Nonlinear optical materials, PMMA, Thin films, Optical limiting
出版物
OPTICAL MATERIALS
Volume 84, Issue -, Pages 28-37
出版商
Elsevier BV
发表日期
2018-06-28
DOI
10.1016/j.optmat.2018.06.050

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