4.8 Article

Transient Characteristics for Proton Gating in Laterally Coupled Indium-Zinc-Oxide Transistors

期刊

ACS APPLIED MATERIALS & INTERFACES
卷 7, 期 11, 页码 6205-6210

出版社

AMER CHEMICAL SOC
DOI: 10.1021/acsami.5b00327

关键词

proton gating; laterally coupling; interfacial electric-double layer (EDL); transient characteristics

资金

  1. National Program on Key Basic Research Project [2012CB933004]
  2. National Natural Science Foundation of China [11474293]
  3. Zhejiang Provincial Natural Science Foundation of China [LY14A040009]
  4. Ningbo Natural Science Foundation [2014A610145]

向作者/读者索取更多资源

The control and detection over processing, transport and delivery of chemical species is of great importance in sensors and biological systems. The transient characteristics of the migration of chemical species reflect the basic properties in the processings of chemical species. Here, we observed the field-configurable proton effects in a laterally coupled transistor gated by phosphorosilicate glass (PSG). The bias on the lateral gate would 0 5 modulate the interplay between protons and electrons at the PSG/indium-zinc-oxide (IZO) channel interface. Due to the modulation of protons flux within the PSG films, the IZO channel current would be modified correspondingly. The characteristic time for the proton gating is estimated to be on the order of 20 ms. Such laterally coupled oxide based transistors with proton gating are promising for low-cost portable biosensors and neuromorphic system applications.

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