Measuring Three-Dimensional Strain and Structural Defects in a Single InGaAs Nanowire Using Coherent X-ray Multiangle Bragg Projection Ptychography

标题
Measuring Three-Dimensional Strain and Structural Defects in a Single InGaAs Nanowire Using Coherent X-ray Multiangle Bragg Projection Ptychography
作者
关键词
-
出版物
NANO LETTERS
Volume 18, Issue 2, Pages 811-819
出版商
American Chemical Society (ACS)
发表日期
2018-01-19
DOI
10.1021/acs.nanolett.7b04024

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