4.8 Article

Second-Order Raman Scattering in Exfoliated Black Phosphorus

期刊

NANO LETTERS
卷 18, 期 2, 页码 1018-1027

出版社

AMER CHEMICAL SOC
DOI: 10.1021/acs.nanolett.7b04486

关键词

Black phosphorus; doubly resonant Raman; phonon-defect modes; anisotropic properties

资金

  1. Natural Sciences and Engineering Research Council of Canada (NSERC)
  2. Canada Research Chairs program
  3. Institut de l'Energie Trottier
  4. Fonds de Recherche du Quebec - Nature et Technologie (FRQNT)
  5. Canada Foundation for Innovation (CFI)
  6. ministere de l'Economie, de la science et de l'innovation du Quebec (MESI)
  7. Fonds de recherche du Quebec - Nature et technologies (FRQNT)

向作者/读者索取更多资源

Second-order Raman scattering has been extensively studied in carbon-based nanomaterials, for example, nanotube and graphene, because it activates normally forbidden Raman modes that are sensitive to crystal disorder, such as defects, dopants, strain, and so forth. The sp(2)-hybridized carbon systems are, however, the exception among nanomaterials, where first-order Raman processes usually dominate. Here we report the identification of four second-order Raman modes, named D-1, D'(1), D-2 and D'(2), in exfoliated black phosphorus (P(black)), an elemental direct-gap semiconductor exhibiting strong mechanical and electronic anisotropies. Located in close proximity to the A(g)(1) and A(g)(2) modes, these new modes dominate at an excitation wavelength of 633 nm. Their evolutions as a function of sample thickness, excitation wavelength, and defect density indicate that they are defect-activated and involve high-momentum phonons in a doubly resonant Raman process. Ab initio simulations of a monolayer reveal that the D' and D modes occur through intravalley scatterings with split contributions in the armchair and zigzag directions, respectively. The high sensitivity of these D modes to disorder helps explaining several discrepancies found in the literature.

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