期刊
MATERIALS CHARACTERIZATION
卷 146, 期 -, 页码 347-358出版社
ELSEVIER SCIENCE INC
DOI: 10.1016/j.matchar.2018.05.015
关键词
Atom probe microscopy; Atom probe tomography; Density functional theory; Microstructure-property relationships
类别
资金
- Australian Research Council
- University of Sydney
- Australian Government under the NCRIS program
- Faculty of Engineering and IT cluster program
The capability of precisely determining the atomic identity and position, coupled with an understanding of the inter-atomic interactions is crucial to enabling microstructure-property relationships in modern materials science. Two approaches to the investigation of materials at the atomic-scale are atom probe microscopy (APM) and density functional theory (DFT). On the one hand, APM offers an ultimate in 3D elemental analysis by determining the chemical identity and atomic position in a material. On the other, first principles DFT simulations allow the prediction of atomic structure and, critically, the electronic structure which is the gateway to calculating the real-world properties of materials. Both approaches are undertaken at the atomic-scale, and so are intrinsically complementary. This paper provides a review of the opportunities and challenges in combining these approaches to do materials science. We first summarise the status of these approaches and set out a framework for the current main workflows by which APM experiments inform DFT simulations and vice-versa. We point out certain gaps between the approaches and ways that these may be bridged via a series of case studies organised into the aforementioned workflow framework.
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