Influence of 20 MeV electron irradiation on the optical properties and phase composition of SiOx thin films
出版年份 2018 全文链接
标题
Influence of 20 MeV electron irradiation on the optical properties and phase composition of SiOx thin films
作者
关键词
-
出版物
JOURNAL OF APPLIED PHYSICS
Volume 123, Issue 19, Pages 195303
出版商
AIP Publishing
发表日期
2018-05-21
DOI
10.1063/1.5022651
参考文献
相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。- Stable ultrathin surfactant-free surface-engineered silicon nanocrystal solar cells deposited at room temperature
- (2017) Vladimir Švrček et al. Energy Science & Engineering
- Self-assembled silicon nanocrystal arrays for photovoltaics
- (2015) M. Schnabel et al. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
- UV Dosimeters Based on Metal-Oxide-Semiconductor Structures Containing Si Nanocrystals
- (2015) A. Arias et al. Sensor Letters
- Silicon nanocrystal growth under irradiation of electron beam
- (2015) Wei-Qi Huang et al. Scientific Reports
- Silicon quantum dot superlattice solar cell structure including silicon nanocrystals in a photogeneration layer
- (2014) Shigeru Yamada et al. Nanoscale Research Letters
- Intriguing surface-extruded plastic flow of SiOxamorphous nanowire as athermally induced by electron beam irradiation
- (2013) Xianfang Zhu et al. Nanoscale
- Developments in nanocrystal memory
- (2011) Ting-Chang Chang et al. Materials Today
- Characterization of Si–SiOx nanocomposite layers by comparative analysis of computer simulated and experimental infra-red transmission spectra
- (2011) V. Donchev et al. THIN SOLID FILMS
- Ion and electron irradiation-induced effects in nanostructured materials
- (2010) A. V. Krasheninnikov et al. JOURNAL OF APPLIED PHYSICS
- Structural modifications induced by electron irradiation in SiO2glass: Local densification measurements
- (2009) G. Buscarino et al. EPL
- Nanocrystal characterization by ellipsometry in porous silicon using model dielectric function
- (2009) Peter Petrik et al. JOURNAL OF APPLIED PHYSICS
- Effects of Si-rich oxide layer stoichiometry on the structural and optical properties of Si QD/SiO2multilayer films
- (2009) X J Hao et al. NANOTECHNOLOGY
- Polyamorphic transformation induced by electron irradiation ina-SiO2glass
- (2009) G. Buscarino et al. PHYSICAL REVIEW B
- Ellipsometric models for vertically inhomogeneous composite structures
- (2008) P. Petrik PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
- Absorption and transport properties of Si rich oxide layers annealed at various temperatures
- (2008) D Nesheva et al. SEMICONDUCTOR SCIENCE AND TECHNOLOGY
Find Funding. Review Successful Grants.
Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.
ExploreFind the ideal target journal for your manuscript
Explore over 38,000 international journals covering a vast array of academic fields.
Search