Deep Neural Networks for No-Reference and Full-Reference Image Quality Assessment

出版年份 2018 全文链接

标题

作者

关键词

出版物

Volume 27, Issue 1, Pages 206-219

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2017-10-11

DOI

10.1109/tip.2017.2760518

Explore over 38,000 international journals covering a vast array of academic fields.

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started